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Eddy current measurement of layers thicknesses based on reflection coefficient’s spectrum analysis

Authors: Weiying Cheng (Japan Power Engineering and Inspection Corporation; Tohoku University) , Hidetoshi Hashizume (Tohoku University)

  • Eddy current measurement of layers thicknesses based on reflection coefficient’s spectrum analysis

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    Eddy current measurement of layers thicknesses based on reflection coefficient’s spectrum analysis

    Authors: ,

Abstract

The eddy current measurement signals of layered structures are analyzed in terms of transmission and reflection between the layers, so that the contributions from each layer can be clarified. The thicknesses are characterized based on reflection coefficient’s spectrum analysis.

How to Cite:

Cheng, W. & Hashizume, H., (2019) “Eddy current measurement of layers thicknesses based on reflection coefficient’s spectrum analysis”, Review of Progress in Quantitative Nondestructive Evaluation .

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Published on
04 Dec 2019
Peer Reviewed
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