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Towards a better understanding of GIUM microstructure characterisation by grain-scale finite element simulation

Authors: Micha? K. Kalkowski (Imperial College London) , Michael J. S. Lowe (Imperial College London) , Martin Barth (Fraunhofer Institute for Ceramic Technologies and Systems) , Marek Rjelka (Fraunhofer Institute for Ceramic Technologies and Systems) , Bernd Köhler (Fraunhofer Institute for Ceramic Technologies and Systems)

Abstract

We present numerical simulations of the grazing incidence ultrasound microscopy (GIUM) for microstructure characterisation of a coarse-grained austenitic weld. Comparing the results from different weld models with the experimental data, we draw some observations about the contrast mechanisms of GIUM.

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How to Cite: Kalkowski, M. K. , Lowe, M. J. , Barth, M. . , Rjelka, M. . & Köhler, B. . (2019) “Towards a better understanding of GIUM microstructure characterisation by grain-scale finite element simulation”, Review of Progress in Quantitative Nondestructive Evaluation.(0).